Refraction Characteristics of Cold Plasma Thin Film as a Left-Handed Metamaterial

SABAH C.

CHINESE PHYSICS LETTERS, vol.28, no.6, 2011 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 28 Issue: 6
  • Publication Date: 2011
  • Doi Number: 10.1088/0256-307x/28/6/064204
  • Journal Name: CHINESE PHYSICS LETTERS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Middle East Technical University Northern Cyprus Campus Affiliated: No

Abstract

A methodical analysis of refraction characteristics of a plane wave with any arbitrary polarization by a cold plasma thin film as a left-handed metamaterial (CPTF-LHM) which has simultaneously negative permittivity and permeability is presented. Numerical calculations are performed by the transfer matrix method using an in-house developed simulation program code. The results strongly recommend a possibility of manufacturing anti-reflection and/or total-transmission coatings and filters for a wide frequency range and/or by tuning the fraction of thickness of the CPTF-LHM.